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Type: 
Conference
Description: 
Shockley-type Stacking faults (SSF) in hexagonal Silicon Carbide polytypes have received considerable attention in recent years since it has been found that these defects are responsible for the degradation of forward IV characteristics in pin diodes. In order to extend the knowledge on these kind of defects and theoretically support experimental findings (specifically, photoluminescence spectral analysis), we have determined the Kohn-Sham electronic band structures, along the closed path Γ-MK-Γ, using density functional ...
Publisher: 
Trans Tech Publications
Publication date: 
1 Jan 2010
Authors: 

Massimo Camarda, Pietro Delugas, Andrea Canino, Andrea Severino, Nicolò Piluso, Antonino La Magna, Francesco La Via

Biblio References: 
Volume: 645 Pages: 283-286
Origin: 
Materials Science Forum