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Type: 
Conference
Description: 
Article PreviewArticle PreviewArticle PreviewIn this article, using finite element simulations and analytical approaches, we demonstrate that planar rotators [1] can be effectively used to determine both the uniform and gradient residual stresses in thin films with higher accuracy compared to other microstructures.
Publisher: 
Trans Tech Publications
Publication date: 
1 Jan 2011
Authors: 

Massimo Camarda, Ruggero Anzalone, Andrea Severino, Nicolò Piluso, Antonino La Magna, Francesco La Via

Biblio References: 
Volume: 679 Pages: 213-216
Origin: 
Materials Science Forum