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Scanning tip measurement for identification of point defects

Type: 
Journal
Description: 
Publisher: 
Springer Science and Media
Publication date: 
1 Jan 2010
Authors: 

V Raineri, F Giannazzo

Biblio References: 
Volume: 6 Issue: 1 Pages: 1-5
Origin: 
NANOSCALE RESEARCH LETTERS
Link: 
http://scholar.google.com/scholar?cluster=6848690608474024628&hl=en&oi=scholarr

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