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Chapter 3-SiC Characterization and Theory-3.3 Defects-Two Dimensional Imaging of the Laterally Inhomogeneous Au/4H-SiC Schottky Barrier by Conductive Atomic Force Microscopy

Type: 
Journal
Description: 
Publisher: 
Aedermannsdorf, Switzerland: Trans Tech Publications, 1984-
Publication date: 
1 Jan 2007
Authors: 

F Giannazzo, F Roccaforte, SF Liotta, V Raineri

Biblio References: 
Volume: 556557 Pages: 545-548
Origin: 
Materials Science Forum
Link: 
http://scholar.google.com/scholar?cluster=12023775115746748831&hl=en&oi=scholarr

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