Type:
Conference
Description:
Ultraviolet (UV) monitoring is of great interest in the healthcare field to prevent excessive UV exposure risks. In the last years silicon carbide (SiC) has emerged as a suitable material for the fabrication of UV detectors. In this paper we propose a 4H-SiC Schottky photodiode with a continuous very thin Ni 2 Si layer operating at 0V, properly designed for UV radiation monitoring.
Publisher:
Trans Tech Publications Ltd
Publication date:
1 Jan 2016
Biblio References:
Volume: 858 Pages: 1015-1018
Origin:
Materials Science Forum