In this paper we discuss some major aspects on the physics of the phase transition from the amorphous to the face-centered-cubic (fcc) polycrystal in Ge2Sb2Te5 at low temperature. We follow the phase transformation by using structural techniques such as TEM, XRD, and electrical resistivity measurements by using the 4-point-probe technique. The results are interpreted in the framework of a quantitative model.
1 Mar 2010
Volume: 87 Issue: 3 Pages: 294-300