We report an extensive structural characterization of the surface of 1T-PtTe 2 crystals by means of Helium Atom Scattering (HAS) and ultra-high resolution scanning tunnelling microscopy (STM). HAS reveals that this bi-dimensional surface presents a large structural corrugation (backsim 0.33 Å) in ΓM direction. The surface lattice constant of PtTe 2 derived from the positions of the helium diffraction peaks up to fifth order was found to be a=(3.96±0.05) Å, in agreement with STM and X-ray diffraction measurements. This value remains unchanged in the temperature range between 90 and 580 K. These findings suggest that 1T-PtTe 2 behaves similarly to graphene on a weakly-interacting substrate, for which the surface thermal expansion coefficient is zero within experimental error. The electron-phonon coupling constant λ has been determined by recording the thermal attenuation of the elastic diffraction peaks of PtTe …