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Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy (vol 101, 261906, 2012)

Type: 
Journal
Description: 
Publisher: 
AMER INST PHYSICS
Publication date: 
21 Jan 2013
Authors: 

Alessandra Alberti, Filippo Giannazzo

Biblio References: 
Volume: 102 Issue: 3
Origin: 
APPLIED PHYSICS LETTERS
Link: 
http://scholar.google.com/scholar?cluster=3658033023837473669&hl=en&oi=scholarr

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