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Measuring Techniques for the Semiconductor’s Parameters

Type: 
Book
Description: 
Publisher: 
Springer, Cham
Publication date: 
1 Jan 2023
Authors: 

Alessandra Alberti, Filippo Giannazzo, Francesco La Via, Salvatore Lombardo, Antonio M Mio, Giuseppe Nicotra, Stefania Privitera, Riccardo Reitano, Fabrizio Roccaforte, Corrado Spinella, Emanuele Rimini

Biblio References: 
Pages: 117-168
Origin: 
Springer Handbook of Semiconductor Devices
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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