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Reliable evaluation method for interface state density and effective channel mobility in lateral 4H-SiC MOSFETs

Type: 
Journal
Description: 
Publisher: 
IOP Publishing
Publication date: 
9 Jun 2022
Authors: 

Antonio Valletta, Fabrizio Roccaforte, Antonino La Magna, Guglielmo Fortunato, Patrick Fiorenza

Biblio References: 
Origin: 
Semiconductor Science and Technology
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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