In article number 2400598, Capellini and co-workers studied a suspended GeSn/Ge microdisk for on-chip optopelectronics by scanning X-ray diffraction microscopy, a synchrotron-based nanoprobe technique yielding finely resolved maps of all strain tensor components and stoichiometry. Thus, light is shed on the subtle structural deformations within this semiconductor microstructure, that are driven by elastic relaxation and dislocation networks.