D Corso, S Aurite, E Sciacca, D Naso, Salvatore Lombardo, A Santangelo, MC Nicotra, S Cascino
Biblio references: Volume: 47 Issue: 4-5 Pages: 806-809
Origin: Microelectronics Reliability
Patrick Fiorenza, R Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G Toro, Graziella Malandrino, Ignazio L Fragalà
Biblio references: Volume: 47 Issue: 4-5 Pages: 640-644
S Privitera, E Rimini, C Bongiorno, A Pirovano, R Bez
Biblio references: Volume: 257 Issue: 1-2 Pages: 352-354
Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
E Bruno, S Mirabella, E Napolitani, F Giannazzo, V Raineri, F Priolo
Biblio references: Volume: 257 Issue: 1-2 Pages: 181-185
L Calcagno, A Ruggiero, P Musumeci, G Cuttone, F La Via, G Foti
Biblio references: Volume: 257 Issue: 1-2 Pages: 279-282
F Iucolano, F Giannazzo, F Roccaforte, L Romano, MG Grimaldi, V Raineri
Biblio references: Volume: 257 Issue: 1-2 Pages: 336-339
F Ruffino, R De Bastiani, MG Grimaldi, C Bongiorno, F Giannazzo, F Roccaforte, C Spinella, V Raineri
Biblio references: Volume: 257 Issue: 1-2 Pages: 810-814
G Lulli, M Bianconi, M Ferri, G Fortunato, L Mariucci
Biblio references: Volume: 257 Issue: 1-2 Pages: 253-256
Liliana Caristia, Giuseppe Nicotra, Corrado Bongiorno, Nicola Costa, Sebastiano Ravesi, Salvo Coffa, Riccardo De Bastiani, Maria Grazia Grimaldi, Corrado Spinella
Biblio references: Volume: 47 Issue: 4-5 Pages: 777-780
Luigi Mariucci, Paolo Gaucci, Antonio Valletta, François Templier, Guglielmo Fortunato
Biblio references: Volume: 46 Issue: 3S Pages: 1299
Origin: Japanese journal of applied physics
