L Calcagno, A Ruggiero, P Musumeci, G Cuttone, F La Via, G Foti
Biblio references: Volume: 257 Issue: 1-2 Pages: 279-282
Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Patrick Fiorenza, R Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G Toro, Graziella Malandrino, Ignazio L Fragalà
Biblio references: Volume: 47 Issue: 4-5 Pages: 640-644
Origin: Microelectronics Reliability
Luigi Mariucci, Paolo Gaucci, Antonio Valletta, François Templier, Guglielmo Fortunato
Biblio references: Volume: 46 Issue: 3S Pages: 1299
Origin: Japanese journal of applied physics
F Ruffino, A Canino, MG Grimaldi, F Giannazzo, C Bongiorno, F Roccaforte, V Raineri
Biblio references: Volume: 101 Issue: 6 Pages: 064306
Origin: Journal of applied physics
A Severino, A La Magna, R Anzalone, C Bongiorno, E Rimini, F La Via
Biblio references: Volume: 101 Issue: 6 Pages: 063544
Sebania Libertino, Manuela Fichera, Venera Aiello, Giuliana Statello, Patrick Fiorenza, Fulvia Sinatra
Biblio references: Volume: 84 Issue: 3 Pages: 468-473
Origin: Microelectronic engineering
Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Dario Salinas
Biblio references: Volume: 84 Issue: 3 Pages: 441-445
A Lomeo, G D'Arrigo, A Scolaro, M Mudanò, MC Monea, G Mauceri, F Di Stefano, G Cacciaguerra, C Ramondetta
Biblio references: Volume: 13 Issue: 3 Pages: 37-39
Origin: EJVES Extra
F Giannazzo, F Roccaforte, V Raineri
Biblio references: Volume: 84 Issue: 3 Pages: 450-453
F Giannazzo, V Raineri, S Mirabella, G Impellizzeri, F Priolo
Biblio references: Volume: 84 Issue: 3 Pages: 446-449
