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Automatic Image Analysis of Stackingfault

Type:

Conference

Description:

Publisher:

Trans Tech Publications Ltd

Publication date:

1 Jan 2022

Authors:

Annamaria Muoio, Cristiano Calabretta, Viviana Scuderi, Massimo Zimbone, Francesco La Via

Biblio References:

Volume: 1062 Pages: 283-287

Origin:

Materials Science Forum

Link:

https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…