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Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs

Type: 
Conference
Description: 
Publisher: 
IEEE
Publication date: 
27 Mar 2022
Authors: 

Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, S Cascino, A Messina, Vincenzo Vinciguerra, Michele Calabretta, Alessandro Chini

Biblio References: 
Pages: 5B. 3-1-5B. 3-6
Origin: 
2022 IEEE International Reliability Physics Symposium (IRPS)
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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