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Modeling of Atomic Migration Phenomena in Phase Change Memory Devices

Type: 
Conference
Description: 
Publisher: 
IEEE
Publication date: 
1 Jan 2015
Authors: 

G. D'Arrigo L. Crespi, A. Lacaita,M. Boniardi, E. Varesi, A. Ghetti and A. Redaelli

Biblio References: 
Pages: 1-4
Origin: 
Memory Workshop (IMW), 2015 IEEE International
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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