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Type: 
Journal
Description: 
Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose.
Publisher: 
North-Holland
Publication date: 
11 Dec 2014
Authors: 

R Pagano, S Lombardo, F Palumbo, D Sanfilippo, G Valvo, G Fallica, S Libertino

Biblio References: 
Volume: 767 Pages: 347-352
Origin: 
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment