Single Atom Detection Through HAADF-STEM and EELS/EDX Characterization of Fluorophore Ru (bpy) 32+ for Optical DNA-Chip Applications | Catania HQ

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Single Atom Detection Through HAADF-STEM and EELS/EDX Characterization of Fluorophore Ru (bpy) 32+ for Optical DNA-Chip Applications

Type:

Journal

Description:

//static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927615007928/resource/name/firstPage-S1431927615007928a.jpg

Publisher:

Cambridge University Press

Publication date:

1 Aug 2015

Authors:

G Nicotra, EL Sciuto, MF Santangelo, G Villaggio, F Sinatra, C Bongiorno, S Libertino

Biblio References:

Volume: 21 Issue: S3 Pages: 1429-1430

Origin:

Microscopy and Microanalysis

Link:

https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/sin…