2016 | Page 2 | Catania HQ

Mario Scuderi, Marco Esposito, Francesco Todisco, Daniela Simeone, Iolena Tarantini, Luisa De Marco, Milena De Giorgi, Giuseppe Nicotra, Luigi Carbone, Daniele Sanvitto, Adriana Passaseo, Giuseppe Gigli, Massimo Cuscunà

2016-10-27

Biblio references: Volume: 120 Issue: 42 Pages: 24314-24323

Origin: The Journal of Physical Chemistry C

Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors

Gino Giusi, Graziella Scandurra, Sabrina Calvi, Guglielmo Fortunato, Matteo Rapisarda, Luigi Mariucci, Carmine Ciofi

2016-10-19

Biblio references: Volume: 37 Issue: 12 Pages: 1625-1627

Origin: IEEE Electron Device Letters

Ohmic contacts to Gallium Nitride materials

Giuseppe Greco, Ferdinando Iucolano, Fabrizio Roccaforte

2016-10-15

Biblio references: Volume: 383 Pages: 324-345

Origin: Applied Surface Science

Towards a high performing UV-A sensor based on Silicon Carbide and hydrogenated Silicon Nitride absorbing layers

M Mazzillo, Antonella Sciuto, Giovanni Mannino, L Renna, N Costa, P Badalà

2016-10-13

Biblio references: Volume: 11 Issue: 10 Pages: P10010

Origin: Journal of Instrumentation

Novel near-infrared emission from crystal defects in MoS2 multilayer flakes

F Fabbri, E Rotunno, E Cinquanta, D Campi, E Bonnini, D Kaplan, L Lazzarini, M Bernasconi, C Ferrari, M Longo, G Nicotra, A Molle, V Swaminathan, G Salviati

2016-10-04

Biblio references: Volume: 7 Pages: 13044

Origin: Nature communications

Ti/Al‐based contacts to p‐type SiC and GaN for power device applications

Short, long and spatial dynamics of informal employment

Electrical compensation via vacancy–donor complexes in arsenic-implanted and laser-annealed germanium

Surface treatments on AlGaN/GaN heterostructures for gate dielectric Al 2 O 3 thin films grown by Atomic Layer Deposition

Surface treatments on AlGaN/GaN heterostructures for gate dielectric Al2O3 thin films grown by Atomic Layer Deposition

Nanoscale Study of the Tarnishing Process in Electron Beam Lithography-Fabricated Silver Nanoparticles for Plasmonic Applications

Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors

Ohmic contacts to Gallium Nitride materials

Towards a high performing UV-A sensor based on Silicon Carbide and hydrogenated Silicon Nitride absorbing layers

Novel near-infrared emission from crystal defects in MoS2 multilayer flakes

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