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Understanding of the Impact of Carrot-Like Defects Embedded in the 4H-SiC Power MOSFET Structure: A Route for an Effective Device Qualification

Patrick Fiorenza, Enzo Fontana, Giovanni Maira, Cettina Bottari, Salvatore Adamo, Beatrice Carbone, Mario S Alessandrino, Alfio Russo, Salvatore Ethan Panasci, Marco Zignale, Marilena Vivona, Filippo Giannazzo, Fabrizio Roccaforte

2024-09-16

Biblio references: Volume: 8 Pages: 678-679

Origin: Scientific Books of Abstracts
Evolution of the Electrical and Microstructural Properties of Mo/4H-SiC Contact with the Annealing Temperature

Marilena Vivona, Patrick Fiorenza, Giuseppe Greco, Salvatore Di Franco, Gabriele Bellocchi, Paola Mancuso, Simone Rascunà, Antonio Mio, Giuseppe Nicotra, Filippo Giannazzo, Fabrizio Roccaforte

2024-09-16

Biblio references: Volume: 8 Pages: 394-395

Origin: Scientific Books of Abstracts
Stress Fields Distribution and Simulation in 3C-SiC (111) Resonators

Viviana Scuderi, Annamaria Muoio, A Garofalo, Sergio Sapienza, Matteo Ferri, Luca Belsito, Alberto Roncaglia, Francesco La Via

2024-09-16

Biblio references: Volume: 8 Pages: 703-705

Origin: Scientific Books of Abstracts
Heavy Ions Radiation Damage on Silicon and Silicon Carbide Detectors

Francesco La Via, Annamaria Muoio, Gabriele Pasquali, Caterina Ciampi, Carmen Altana, Lucia Calcagno, Salvatore Tudisco

2024-09-16

Biblio references: Volume: 8 Pages: 29-30

Origin: Scientific Books of Abstracts
Effects of Sulfurization on the Properties of 4H-SiC Schottky Contacts

Fabrizio Roccaforte, Marilena Vivona, Salvatore Ethan Panasci, Giuseppe Greco, Patrick Fiorenza, Attila Sulyok, Antal Koos, Béla Pécz, Filippo Giannazzo

2024-09-16

Biblio references: Volume: 8 Pages: 97-99

Origin: Scientific Books of Abstracts
Processing of molybdenum industrial waste into sustainable and efficient nanocatalysts for water electrolysis reactions

Federico Ursino, Giacometta Mineo, Antonino Scandurra, Mario Scuderi, Angelo Forestan, Catya Alba, Riccardo Reitano, Antonio Terrasi, Salvo Mirabella

2024-09-12

Biblio references: Pages: 1-9

Origin: Nano Research
Anomalous Electrical Behavior of 4H-SiC Schottky Diodes in Presence of Stacking Faults

Marilena Vivona, Patrick Fiorenza, Viviana Scuderi, Francesco La Via, Filippo Giannazzo, Fabrizio Roccaforte

2024-09-12

Biblio references: Volume: 361 Pages: 27-32

Origin: Solid State Phenomena
Damage evolution in Plasma Facing Materials by a sequential multiscale approach

G Lo Presti, A La Magna

2024-09-09

Biblio references: Volume: 64 Issue: 10 Pages: 106051

Origin: Nuclear Fusion
TEM Investigation on High Dose Al Implanted 4H-SiC Epitaxial Layer

Cristiano Calabretta, Nicolo Piluso, Corrado Bongiorno, Simona Boninelli, Francesco La Via, Andrea Severino

2024-08-28

Biblio references: Volume: 359 Pages: 7-11

Origin: Solid State Phenomena
Hydrogen Etching Process of 4H-SiC (0001) in Limited Regions

Alfio Mancuso, Simona Boninelli, Massimo Camarda, Patrick Fiorenza, Antonio Mio, Viviana Scuderi, Philippe Godignon, Sofia Aslanidou, Lucia Calcagno, Francesco La Via

2024-08-28

Biblio references: Volume: 359 Pages: 137-143

Origin: Solid State Phenomena

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