2006 | Catania HQ

In-depth investigation of Hf-based high-k dielectrics as storage layer of charge-trap NVMs

J Buckley, M Bocquet, G Molas, M Gely, P Brianceau, N Rochat, E Martinez, F Martin, H Grampeix, JP Colonna, A Toffoli, V Vidal, C Leroux, G Ghibaudo, G Pananakakis, C Bongiorno, D Corso, S Lombardo, B DeSalvo, S Deleonibus

2006-12-11

Biblio references: Pages: 1-4

Origin: 2006 International Electron Devices Meeting

New method for the detection of enzyme immobilized on Si-based glucose Biosensors

S Libertino, V Aiello, P Fiorenza, M Fichera, A Scandurra, F Sinatra

2006-10-22

Biblio references: Pages: 478-481

Origin: SENSORS, 2006 IEEE

Evaluation of the degradation of floating-gate memories with Al2O3 tunnel oxide

J Buckley, G Molas, M Gély, F Martin, B De Salvo, S Deleonibus, G Pananakakis, C Bongiorno, S Lombardo

2006-09-19

Biblio references: Pages: 246-249

Origin: 2006 European Solid-State Device Research Conference

In-depth investigation of hfalo layers as interpoly dielectrics of future flash memories

G Molas, H Grampeix, J Buckley, M Bocquet, X Garros, F Martin, JP Colonna, P Brianceau, V Vidal, M Gely, B De Salvo, S Deleonibus, C Bongiorno, S Lombardo

2006-09-19

Biblio references: Pages: 242-245

Origin: 2006 European Solid-State Device Research Conference

PZT Films on Wafers and Fibers for MEMS Application

Ratnesh Thapliyal, Aude Pellision, Dmitry Logvinovich, Martin Amberg, Hans Josef Hug, Giuseppino Fortunato

2006-07-30

Biblio references: Pages: 336-339

Origin: 2006 15th ieee international symposium on the applications of ferroelectrics

Dedicated Instrumentation for Single-Electron Effects Detection in Si Nanocrystal Memories

C Pace, F Crupi, S Lombardo, G Giusi

2006-04-24

Biblio references: Pages: 1856-1859

Origin: 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings

Design of a RCE photodetectors based on the internal photoemission effect

M Casalino, L Sirleto, L Moretti, S Libertino, I Rendina

2006-04-20

Biblio references: Volume: 6183 Pages: 61831Y

Origin: Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits

In-depth Investigation of Hf-based High-k Dielectrics as Storage Layer of Charge-Trap

J Buckley, M Bocquet, G Molas, M Gely, P Brianceau, N Rochat, E Martinez, F Martin, H Grampeix, JP Colonna, V Vidal, Cédric Leroux, G Ghibaudo, G Pananakakis, C Bongiorno, D Corso, S Lombardo, B Desalvo

2006-01-01

Biblio references: Pages: XX

Origin: NVMsIEDM 2006

Diagnosi precoce di siringocele in età pediatrica: caso clinico

MG Scuderi, E Pappalardo, S Arena, A Benedetto, Di BENEDETTO V

2006-01-01

Biblio references: Pages: ---

Origin: XXXVII Congresso della Società Italiana di Chirurgia Pediatrica.

La tecnica di Mitchel per il trattamento dell’epispadia

Di BENEDETTO V, C Arena, MG Scuderi, F Scalisi, G Sanges, A Benedetto

2006-01-01

Biblio references: Pages: ---

Origin: XXII Congresso Nazionale Società Italiana di Urologia Pediatrica.

In-depth investigation of Hf-based high-k dielectrics as storage layer of charge-trap NVMs

New method for the detection of enzyme immobilized on Si-based glucose Biosensors

Evaluation of the degradation of floating-gate memories with Al2O3 tunnel oxide

In-depth investigation of hfalo layers as interpoly dielectrics of future flash memories

PZT Films on Wafers and Fibers for MEMS Application

Dedicated Instrumentation for Single-Electron Effects Detection in Si Nanocrystal Memories

Design of a RCE photodetectors based on the internal photoemission effect

In-depth Investigation of Hf-based High-k Dielectrics as Storage Layer of Charge-Trap

Diagnosi precoce di siringocele in età pediatrica: caso clinico

La tecnica di Mitchel per il trattamento dell’epispadia

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