2010 | Catania HQ

X-ray irradiation influence on prototype Er3+-optical fibers: confocal luminescence study

M Vivona, Sébastien Girard, C Marcandella, T Robin, B Cadier, Marco Cannas, A Boukenter, Y Ouerdane

2010-10-14

Biblio references: Volume: 7839 Pages: 78391H

Origin: 2nd Workshop on Specialty Optical Fibers and Their Applications (WSOF-2)

Radiation effects on rare-earth doped optical fibers

Sylvain Girard, Youcef Ouerdane, Marilena Vivona, Blandine Tortech, Thierry Robin, Aziz Boukenter, C Marcandella, Benoît Cadier, Jean-Pierre Meunier

2010-09-15

Biblio references: Volume: 7817 Pages: 78170I

Origin: Nanophotonics and Macrophotonics for Space Environments IV

Understanding dark current in pixels of silicon photomultipliers

R Pagano, S Lombardo, S Libertino, G Valvo, G Condorelli, B Carbone, DN Sanfilippo, G Fallica

2010-09-14

Biblio references: Pages: 265-268

Origin: 2010 Proceedings of the European Solid State Device Research Conference

Compact instrumentation for radiation tolerance test of flash memories in space environment

Calogero Pace, Ernesto Della Sala, Giuseppe Capuano, Sebania Libertino, Isodiana Crupi, Antonio Marino, Salvatore Lombardo, Michael Lisiansky, Yakov Roizin

2010-05-03

Biblio references: Pages: 652-655

Origin: 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings

Hybrid silicon nanocrystals/SiN charge trapping layer with high-k dielectrics for FN and CHE programming

G Gay, G Molas, M Bocquet, E Jalaguier, M Gély, L Masarotto, JP Colonna, H Grampeix, F Martin, P Brianceau, V Vidal, R Kies, C Bongiorno, S Lombardo, T Baron, G Ghibaudo, B De Salvo

2010-04-26

Biblio references: Pages: 54-55

Origin: Proceedings of 2010 International Symposium on VLSI Technology, System and Application

Dark count in single photon avalanche Si detectors

R Pagano, S Libertino, G Valvo, G Condorelli, B Carbone, A Piana, M Mazzillo, DN Sanfilippo, GG Fallica, G Falci, S Lombardo

2010-02-25

Biblio references: Volume: 7598 Pages: 75980Z

Origin: Optical Components and Materials VII

Preliminary radiation hardness tests of single photon Si detectors

R Pagano, S Libertino, G Valvo, G Condorelli, B Carbone, A Piana, M Mazzillo, DN Sanfilippo, PG Fallica, F Principato, G Cannella, G Falci, S Lombardo

2010-02-16

Biblio references: Volume: 7606 Pages: 760607

Origin: Silicon Photonics V

Growth rate effect on 3C-SiC film residual stress on (100) Si substrates

Ruggero Anzalone, Christopher Locke, J Carballo, Nicolò Piluso, Andrea Severino, Giuseppe D'Arrigo, AA Volinsky, Francesco La Via, Stephen E Saddow

2010-01-01

Biblio references: Volume: 645 Pages: 143-146

Origin: Materials Science Forum

Reliability of Thin Thermally Grown SiO2 on 3C-SiC Studied by Scanning Probe Microscopy

Jens Eriksson, Ming Hung Weng, Fabrizio Roccaforte, Filippo Giannazzo, Patrick Fiorenza, Jean Lorenzzi, Gabriel Ferro, Vito Raineri

2010-01-01

Biblio references: Volume: 645 Pages: 833-836

Origin: Materials Science Forum

Uniformity of Epitaxial Graphene on On-axis and Off-axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Sushant Sonde, Filippo Giannazzo, Jean Roch Huntzinger, Antoine Tiberj, Mikael Syväjärvi, Rositza Yakimova, Vito Raineri, Jean Camassel

2010-01-01

Biblio references: Volume: 645 Pages: 607-610

Origin: Materials Science Forum

X-ray irradiation influence on prototype Er3+-optical fibers: confocal luminescence study

Radiation effects on rare-earth doped optical fibers

Understanding dark current in pixels of silicon photomultipliers

Compact instrumentation for radiation tolerance test of flash memories in space environment

Hybrid silicon nanocrystals/SiN charge trapping layer with high-k dielectrics for FN and CHE programming

Dark count in single photon avalanche Si detectors

Preliminary radiation hardness tests of single photon Si detectors

Growth rate effect on 3C-SiC film residual stress on (100) Si substrates

Reliability of Thin Thermally Grown SiO2 on 3C-SiC Studied by Scanning Probe Microscopy

Uniformity of Epitaxial Graphene on On-axis and Off-axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Pages

Scientific Productions

Units in Italy

Contact info

Link Utili

You are here

Pages

Scientific Productions

Units in Italy

Contact info

Link Utili