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Carrier distribution in quantum nanostructures studied by scanning capacitance microscopy

F Giannazzo, V Raineri, S Mirabella, G Impellizzeri, F Priolo, M Fedele, R Mucciato

2005-01-01

Biblio references: Pages: 487-490

Origin: Microscopy of Semiconducting Materials
Amorphous-to-fcc Transition in GeSbTe Alloys

S Privitera, C Bongiorno, E Rimini, R Zonca

2005-01-01

Biblio references: Pages: 189-196

Origin: Materials for Information Technology