Filippo Giannazzo, Samuel Lara Avila, Jens Eriksson, Sushant Sonde
Biblio references:
Origin:
Filippo Giannazzo, Giuseppe Greco, Fabrizio Roccaforte, Chandreswar Mahata, Mario Lanza
Biblio references: Pages: 303-350
Origin: Electrical Atomic Force Microscopy for Nanoelectronics
