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  • Measuring Techniques for the Semiconductor’s Parameters

    Alessandra Alberti, Filippo Giannazzo, Francesco La Via, Salvatore Lombardo, Antonio M Mio, Giuseppe Nicotra, Stefania MS Privitera, Riccardo Reitano, Fabrizio Roccaforte, Corrado Spinella, Emanuele Rimini

    2022-11-11

    Biblio references: Pages: 117-168

    Origin: Springer Handbook of Semiconductor Devices

  • The development of a fully MRI-compatible silicon carbide neural interface

    Mohammad Beygi, William Dominguez-Viqueira, Gokhan Mumcu, Christopher L Frewin, Francesco La Via, Stephen E Saddow

    2022-01-01

    Biblio references: Pages: 161-195

    Origin: Silicon Carbide Technology for Advanced Human Healthcare Applications

Scientific Productions