G Nicotra, C Bongiorno, C Spinella, E Rimini
Biblio references: Pages: 415-416
Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
M Casalino, L Sirleto, L Moretti, D Panzera, S Libertino, I Rendina
Biblio references: Pages: 504-509
Origin: Sensors And Microsystems
Filippo Giannazzo, Patrick Fiorenza, Vito Raineri
Biblio references: Pages: 63-103
Origin: Applied Scanning Probe Methods X
F Priolo, G Franzò, A Irrera, F Iacona, S Boninelli, M Miritello, A Canino, C Bongiorno, C Spinella, D Sanfilippo, G Di Stefano, A Piana, G Fallica
Biblio references: Pages: 291-300
Origin: Microscopy of Semiconducting Materials 2007
V AIELLO, M FICHERA, F GIANNAZZO, S LIBERTINO, A SCANDURRA, M REINS, F SINATRA
Biblio references: Pages: 3-13
