Filippo Giannazzo, Patrick Fiorenza, Vito Raineri
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Origin: Applied Scanning Probe Methods X
V AIELLO, M FICHERA, F GIANNAZZO, S LIBERTINO, A SCANDURRA, M REINS, F SINATRA
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Origin: Sensors And Microsystems
F Priolo, G Franzò, A Irrera, F Iacona, S Boninelli, M Miritello, A Canino, C Bongiorno, C Spinella, D Sanfilippo, G Di Stefano, A Piana, G Fallica
Biblio references: Pages: 291-300
Origin: Microscopy of Semiconducting Materials 2007
Raffaella Lo Nigro, Graziella Malandrino, Roberta G Toro, Ignazio L Fragalà
Biblio references: Pages: 33-51
Origin: Rare Earth Oxide Thin Films
A LA MAGNA, I DERETZIS
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Origin: Applied And Industrial Mathematics In Italy II
Massimiliano Belluso, Giovanni Bonanno, Sergio Billotta, Antonio Calì, Salvo Scuderi, Massimo Cataldo Mazzillo, Piergiorgio G Fallica, Delfo Sanfilippo, Emilio Sciacca, Salvatore Lombardo
Biblio references: Pages: 461-468
Origin: Scientific detectors for astronomy 2005
FABRIZIO ROCCAFORTE, FRANCESCO LA VIA, VITO RAINERI
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Origin: SiC Materials and Devices: Volume 1
Sebania Libertino, A Sciuto
Biblio references: Pages: 53-95
Origin: Optical Interconnects
Stefania Specchia, G Saracco, G D'Arrigo, C Spinella, M Sgroi, G Bollito
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Origin: Titolo volume non avvalorato
Vincenzo Di Benedetto, Carmela Arena, Maria Grazia Scuderi, Aurelio Di Benedetto
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