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Stress evaluation on hetero-epitaxial 3C-SiC film on (100) Si substrates

Ruggero Anzalone, M Camarda, C Locke, J Carballo, N Piluso, G D'Arrigo, A Severino, AA Volinsky, SE Saddow, F La Via

2012-01-01

Biblio references: Volume: 717 Pages: 521-524

Origin: Materials Science Forum
Mechanical proprieties and residual stress evaluation on heteroepitaxial 3C-SiC/Si for MEMS application

Ruggero Anzalone, Giuseppe D'Arrigo, Massimo Camarda, Nicolò Piluso, Andrea Severino, Francesco La Via

2012-01-01

Biblio references: Volume: 711 Pages: 51-54

Origin: Materials Science Forum
Effects of different post-implantation annealing conditions on the electrical properties of interfaces to p-type implanted 4H-SiC

Alessia Frazzetto, Fabrizio Roccaforte, Filippo Giannazzo, R Lo Nigro, M Saggio, Edoardo Zanetti, Vito Raineri

2012-01-01

Biblio references: Volume: 717 Pages: 825-828

Origin: Materials Science Forum
Consideration on the thermal expansion of 3C-SiC epitaxial layer on Si substrates

Andrea Severino, Massimo Camarda, Antonino La Magna, Francesco La Via

2012-01-01

Biblio references: Volume: 711 Pages: 31-34

Origin: Materials Science Forum
Chloride-Based CVD of 4H-SiC at High Growth Rates on Substrates with Different Off-Angles

Stefano Leone, Henrik Pedersen, Franziska Christine Beyer, Sven Andersson, Olof Kordina, Anne Henry, Andrea Canino, Francesco La Via, Erik Janzén

2012-01-01

Biblio references: Volume: 717 Pages: 113-116

Origin: Materials Science Forum
Microstructure and Transport Properties in Alloyed Ohmic Contacts to P-Type SiC and GaN for Power Devices Applications

Fabrizio Roccaforte, Alessia Frazzetto, Giuseppe Greco, Raffaella Lo Nigro, Filippo Giannazzo, Michał Leszczyński, Pawel Prystawko, Edoardo Zanetti, Mario Saggio, Vito Raineri

2012-01-01

Biblio references: Volume: 711 Pages: 203-207

Origin: Materials Science Forum
Vertically oriented graphene flakes deposited during electric field assisted laser ablation of carbon targets in water

P Russo, M Sinatra, O Puglisi, G Compagnini, S Scalese

2012-01-01

Biblio references:

Origin: ANGEL 2012
Micro-and Nano-Scale Electrical Characterization of Epitaxial Graphene on Off-Axis 4H-SiC (0001)

Filippo Giannazzo, Corrado Bongiorno, Salvatore di Franco, Emanuele Rimini, Vito Raineri

2012-01-01

Biblio references: Volume: 717 Pages: 637-640

Origin: Materials Science Forum
Evolution of structural and electrical properties of Au/Ni contacts onto p-GaN after annealing

Giuseppe Greco, Fabrizio Roccaforte, R Lo Nigro, C Bongiorno, S Di Franco, P Prystawko, M Leszczyński, Vito Raineri

2012-01-01

Biblio references: Volume: 717 Pages: 1295-1298

Origin: Materials Science Forum
Extended characterization of the stress fields in the heteroepitaxial growth of 3C-SiC on silicon for sensors and device applications

Massimo Camarda, Ruggero Anzalone, Nicolò Piluso, Andrea Severino, Andrea Canino, Francesco La Via, Antonino La Magna

2012-01-01

Biblio references: Volume: 717 Pages: 517-520

Origin: Materials Science Forum

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