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Ion-beam induced modifications of titanium Schottky barrier on 4H-SiC

Fabrizio Roccaforte, Filippo Giannazzo, Corrado Bongiorno, Sebania Libertino, Francesco La Via, Vito Raineri

2005-01-01

Biblio references: Volume: 483 Pages: 729-732

Origin: Materials Science Forum
Cobalt contamination in silicon

Maria Luisa Polignano, Daniele Caputo, Davide Codegoni, Vittorio Privitera, M Riva

2005-01-01

Biblio references: Volume: 108 Pages: 571-576

Origin: Solid State Phenomena

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