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Defect evolution in ion irradiated 6H-SiC epitaxial layers

Alfonso Ruggiero, M Zimbone, Fabrizio Roccaforte, Sebania Libertino, Francesco La Via, Ricardo Reitano, Lucia Calcagno

2005-01-01

Biblio references: Volume: 483 Pages: 485-488

Origin: Materials Science Forum
Cobalt contamination in silicon

Maria Luisa Polignano, Daniele Caputo, Davide Codegoni, Vittorio Privitera, M Riva

2005-01-01

Biblio references: Volume: 108 Pages: 571-576

Origin: Solid State Phenomena

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