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Multiscale Simulations of Plasma Etching in Silicon Carbide Structures

Markus Italia, Ioannis Deretzis, Alfio Nastasi, Silvia Scalese, Antonino La Magna, Massimo Pirnaci, Daniele Pagano, Dario Tenaglia, Patrizia Vasquez

2022-01-01

Biblio references: Volume: 1062 Pages: 214-218

Origin: Materials Science Forum
Optical Characterization of 4H-SiC Thick Epitaxial Layer for Particle Detection

Alessandro Meli, Annamaria Muoio, Riccardo Reitano, Antonio Trotta, Miriam Parisi, Laura Meda, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 278-282

Origin: Materials Science Forum
Electrical Scanning Probe Microscopy Investigation of Schottky and Metal-Oxide Junctions on Hetero-Epitaxial 3C-SiС on Silicon

Filippo Giannazzo, Patrick Fiorenza, E Schiliro, Salvatore Di Franco, Sylvain Monnoye, Hugues Mank, Marcin Zielinski, Francesco La Via, Fabrizio Roccaforte

2022-01-01

Biblio references: Volume: 1062 Pages: 400-405

Origin: Materials Science Forum
Automatic Image Analysis of Stackingfault

Annamaria Muoio, Cristiano Calabretta, Viviana Scuderi, Massimo Zimbone, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 283-287

Origin: Materials Science Forum
Review of Sublimation Growth of SiC Bulk Crystals

Peter J Wellmann, Matthias Arzig, Jonas Ihle, Manuel Kollmuss, Johannes Steiner, Marco Mauceri, Danilo Crippa, Francesco La Via, Michael Salamon, Norman Uhlmann, Melissa Roder, Andreas N Danilewsky, Binh Duong Nguyen, Stefan Sandfeld

2022-01-01

Biblio references: Volume: 1062 Pages: 104-112

Origin: Materials Science Forum
Structural and Electrical Characterization of Ni-Based Ohmic Contacts on 4H-SiC Formed by Solid-State Laser Annealing

Paolo Badalà, Emanuele Smecca, Simone Rascunà, Corrado Bongiorno, Egidio Carria, Anna Bassi, Gabriele Bellocchi, Silvia Castorina, Cristina Tringali, Antonino La Magna, Alessandra Alberti

2022-01-01

Biblio references: Volume: 1062 Pages: 417-421

Origin: Materials Science Forum
High Temperature Etching for Threading Dislocation Investigation on GaN Epi-Layer

Ruggero Anzalone, Giuseppe Greco, Fabrizio Roccaforte, Patrick Fiorenza, Nicolò Piluso, Andrea Severino

2022-01-01

Biblio references: Volume: 1062 Pages: 18-22

Origin: Materials Science Forum
Neutron Detection Study through Simulations with Fluka

Annamaria Muoio, Alessandro Meli, Antonio Trotta, Miriam Parisi, Laura Meda, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 509-513

Origin: Materials Science Forum
Charge Trapping Mechanisms in Nitridated SiO2/4H-SiC MOSFET Interfaces: Threshold Voltage Instability and Interface Chemistry

Patrick Fiorenza, Corrado Bongiorno, A Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte

2022-01-01

Biblio references: Volume: 1062 Pages: 160-164

Origin: Materials Science Forum
Graphite Assisted P and Al Implanted 4H-SiC Laser Annealing

Cristiano Calabretta, Alessandro Pecora, Marta Agati, Stefania Privitera, Annamaria Muoio, Simona Boninelli, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 204-208

Origin: Materials Science Forum

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