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Biblio references:
Origin: Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN)
Waldemar Kaiser, Damiano Ricciarelli, Edoardo Mosconi, Asma A Alothman, Francesco Ambrosio, Filippo De Angelis
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Origin: 2022 IEEE International Reliability Physics Symposium (IRPS)
S Alessandrino, B Carbone, F Cordiano, B Mazza, A Russo, W Coco, M Boscaglia, A Di Salvo, A Lombardo, D Scarcella, E Vitanza, P Fiorenza
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Patrick Fiorenza, C Bongiorno, A Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte
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Origin: Materials Science Forum
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Cristiano Calabretta, Viviana Scuderi, Ruggero Anzalone, Annalisa Cannizzaro, Marco Mauceri, Danilo Crippa, Simona Boninelli, Francesco La Via
Biblio references: Volume: 1062 Pages: 64-68
Tommaso Fazio, Giuseppe Fisicaro, Ioannis Deretzis, Elisabetta Paladino, Antonino La Magna
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Mattia Pizzone, Maria Grazia Grimaldi, Antonino La Magna, Neda Rahmani, Silvia Scalese, Jost Adam, Rosaria Puglisi
