L Laurin, M Baldo, E Petroni, G Samanni, L Turconi, A Motta, M Borghi, A Serafini, D Codegoni, M Scuderi, S Ran, A Claverie, D Ielmini, R Annunziata, A Redaelli
Biblio references: Pages: 1-7
Origin: 2023 IEEE International Reliability Physics Symposium (IRPS)