Alessandro Sitta, Sebastiano Russo, Marco Torrisi, Angelo Alberto Messina, Giuseppe D’Arrigo, Gaetano Sequenzia, Marco Renna, Michele Calabretta
Biblio references: Pages: 1-5
Origin: 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)